SSIMS Static Secondary Ion Mass Spectrometry

Intertek provides expert surface analysis for client surface-imaging projects that require Static Secondary Ion Mass Spectrometry (Surface SIMS, SSIMS) for best results. SSIMS allows molecular identification of organic and inorganic materials at surfaces.  Often the surface of a material is what that delivers the benefit or special feature to a product.

With SIMS analysis, Intertek scientists measure the surface situation and provide clients with vital data and a better understanding of what is really going on at the surface level. Intertek MSG has wide and varied experience in using SSIMS to identify and characterise problems only SSIMS is best placed to handle. Contact Intertek for more information on how use of SSIMS may be appropriate for your situation.

The extremely shallow molecular surface analysis depth of SSIMS compared to other microscopy techniques allow clients to better understand the absolute nano-scale surface of a material. This information is useful for trouble-shooting production problems, research and development, resolving patent disputes and many other applications.

Examples of Intertek Surface SIMS scientists providing clients with answers to critical issues:

• A pharmaceutical manufacturer's patent was threatened by a rival company. Work from the Intertek MSG SSIMS team analysed the drug and compared it to its generic rival. The SSIMS analysis results were essential to the successful result of the consequential patent litigation in favour of the client.
  

• Identification of silicone-based lubricants that can stop production lines, leading to often expensive disputes between suppliers and customers.
  
• Microscopic blobs of silicone lubricant in the wrong place can give significant problems with carbon fibre. In one case silicone lubricant caused problems with the production of cruise missles. Use of Intertek SSIMS identified the issue and helped to resolve the problem.