Intertek SEM microstructure and surface analysis labs offer advanced analytical techniques for visualising and measuring microscopic features to nanoscale dimensions. Scanning Electron Microscopy (SEM) testing is effective for material analysis, pitting, failure analysis, characterization of dust, deposits, contaminants, particles, filter residues, and many other applications. Intertek SEM labs are located in the USA, UK, France and Australia.

Surface and Structural Materials Analysis:
Microstructural characterisation includes the analysis of materials, polymers, films, coatings, geological and mineral core samples, pharmaceuticals, raw materials, metals, plastics, ceramics, glass, food, dust, contaminants, unknowns and other products. The SEM labs provide elemental analysis of solid samples, impurities, and the identification of physical and chemical defects. The laboratories provide anaytical expertise to support research, failure analysis, troubleshooting, quality control and other requirements.

Scanning Electron Microscopy:
The Scanning Electron Microscope analyses the surface of solid objects, producing images of higher resolution than optical microscopy. SEM produces representations of three-dimensional samples from a diverse range of materials. Backscatter and cathodoluminescence (SEM-CL) are common techniques used to evaluate a wide range of samples.

Energy Dispersive X-ray Analysis:
SEM/EXDA analysis of small particles by scanning electron microscopy and energy dispersive X-ray analysis (EDXA) is possible without destruction or injury to the sample. SEM/EXDA provides qualitative elemental analysis and element localisation on samples being analysed.

Intertek SEM laboratories are useful for corrosion evaluation and control. Corrosive deposits, pitting, hydrogen embrittlement and microbial attacks can be identified and measured.