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X-Ray Diffraction Analysis (XRD) is the primary tool for investigating the structure of crystalline materials, from atomic arrangement to crystallite size and imperfections.
Intertek Diffractometers enable:
- Reflection, transmission or capillary geometry
in-situ high temperature & reactive environment
- Solid or liquid samples
- Orientation / texture
- Divergent or parallel beam
- Grazing incidence
- Reflectometry
- Kratky Small Angle X-ray Scattering (SAXS) Camera with temperature control
Applications of XRD analysis includes:
- Nano-materials: phase composition, crystallite size and shape, lattice distortions and faulting, composition variations, orientation, in situ structure development .
- Catalysts: for nano-materials, with monitoring of structure throughout manufacturing and use to develop structure-property relationships.
- New materials developmen : in situ measurements are important to understand what really happens during processing and can reduce total development costs.
- Polymers & Composites: crystalline form, crystallinity, crystalline perfection, orientation - all likely to affect performance.
- Pharmaceuticals & Organics: polymorphs, crystallinity, and orientation are important to performance and can be followed by XRD, including in-situ studies. XRD qualified to GMP standards.
The Intertek XRD Advantage:
- Experience with a wide range of sample types and formats.
- Specialists in studies under process conditions with various hardware & software solutions.
- Structure at the nano-scale: crystallite size and shape, lattice distortion, faulting.
- Crystalline materials information includes phase composition, structure variations (solid solutions and polymorphs), crystallinity & orientation
Non-crystalline periodicity, size and orientation.
- XRD analysis to GMP standards
- Contact Intertek for more information for X-Ray Diffraction Analysis.
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