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The wavelength of X-rays is on the atomic scale, making X-ray diffraction (XRD) a primary tool for probing structure of nano-materials. The analysis of crystalline materials, semi-crystalline materials and amorphous materials to the nano-scale are possible with X-Ray Diffraction from Intertek. Intertek X-Ray Diffraction laboratories are world-class facilities staffed by scientists with years of XRD experience, working with a wide range of materials at the nano-scale level.
Crystallite dimensions and
size are fundamental characteristics of nano-materials and microstructure (nanostructure) and can be important to understanding and controlling bulk properties. Small crystallite size results in broadened diffraction patterns. Analysis of peak shapes can give information about crystallite size and other aspects of microstructure, particularly lattice distortions (due to variations in composition or micro-strain) and faulting.
Intertek XRD scientists analyse line broadening using a simulation and refinement method that gives crystallite size distributions independent of any mathematical function to fit peak shapes. This means that multi-modal distributions can readily be characterised. Since this broadening is related to the geometry of lattice planes within the crystallites, it is often possible to determine shape parameters by analysing multiple lines.
XRD provides the most adaptable method for measuring crystalline phases, degree of crystallinity and structures.
In materials measured range from polymers to glass ceramics. Detailed information about crystallinity can be obtained by refining crystal structure parameters as a basis for structure and property relationships, e.g. in relation to the formation of solid solutions.
Crystalline orientation is another important measurement provided by XRD. Crystallites in a fabricated structure are often oriented as a design feature or as a characteristic of the processing technology. Nano-scale orientation can effect product performance. For example measuring the orientation distribution of tiny nano-metre thick platelets on the surface of a polymer film can indicate alignment with the film surface, which can have a major impact on the surface properties of the polymer.
In-Situ measurements by XRD help clients understand what really happens during processing, and helps reduce total costs of exploring different process conditions. In addition to following the kinetics of the phase changes, a more complete model of the system can be based on changes in the lattice parameters and crystallite sizes of the components.
Contact Intertek for more information.
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