| Measurement Science Group > Capabilities > X-Ray Diffraction |
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X-Ray Diffraction |
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Structure at the nano-scale.
Methods
Three Bruker diffractometers which enable:
- reflection, transmission or capillary geometry
- in situ high temperature & reactive environment
- solid or liquid samples
- orientation / texture
- divergent or parallel beam
- grazing incidence
- reflectometry
- Kratky Small Angle X-ray Scattering (SAXS) Camera with temperature control.
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Applications of XRD
XRD is the primary tool for investigating the structure of crystalline materials, from atomic arrangement to crystallite size and imperfections. Application areas include:
- Nano-materials : phase composition, crystallite size and shape, lattice distortions and faulting, composition variations, orientation, in situ structure development
- Catalysts : as for nano-materials, with monitoring of structure throughout manufacturing and use to develop structure-property relationships
- New materials development : in situ measurements are important to understand what really happens during processing and can reduce total development costs
- Polymers & Composites : crystalline form, crystallinity, crystalline perfection, orientation - all likely to affect performance
- Pharmaceuticals & Organics : polymorphs, crystallinity, and orientation are important to performance and can be followed by XRD, including in situ studies
The MSG advantage
- Experience with a wide range of sample types and formats
- Specialists in studies under process conditions with various hardware & software solutions
- Structure at the nano-scale: crystallite size and shape, lattice distortion, faulting
- Crystalline materials information includes phase composition, structure variations (e.g. solid solutions and polymorphs), crystallinity & orientation
- Non-crystalline periodicity, size and orientation
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| Advice is available, so make the call +44 (0) 1642 435788 or email MSGenquiry@intertek.com |
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