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Measurement Science Group > Capabilities > Transmission Electron Microscopy (TEM)

Transmission Electron Microscopy

Microscopy, microanalysis and materials characterization

 

Intertek MSG provides Transmission Electron Microscopy (TEM) for the analysis of client samples and applications. The TEM instrument yields information on the internal structure of a wide range of materials, and Intertek scientists with years of industry experience provide interpretation of the resulting image data for clients to better understand what the TEM results mean.

Intertek is expert in sample prepartion, as TEM analysis often requires preparation of sample film or sections no thicker than 60-80 nanometres, through which the electron beam is transmitted. Analagous in function to a light microscope, the transmission electron microscope uses magnetic lenses to focus a magnified image onto a phosphorescent screen or digital camera.

Sample preparation may involve not only the skilled art of ultramicrotomy, but also embrittlement by cooling or chemical fixation, and staining to impart contrast to the image. Ultra-fine particulates or dried latex

Materials may also be held on thin support films for examination. Contact Intertek MSG for more information.

Examples of TEM Studies conducted by Intertek:

  • Biological TEM GLP Laboratory
  • Degree of encapsulation of titanium dioxide within polymeric material.
  • Size and structure of nano-inorganic materials and their dispersion within an epoxy matrix.
  • Exfoliation and distribution of nano-clay particles within epoxy systems for use within the aerospace industry.
  • Characterisation of catalyst particle architecture
  • Study of fracture effects on impact modifier particles and acrylic matrix using chemical staining techniques.
  • Assessment of size and shape for nano-metallic particles used in the electronics industry.
  • Determination of metallised layer thickess and structure  within packaging applications.
  • Structure of carbon nanotubes along with EDX analysis of metallic seed particles used in their production.
  • Morphology of adhesive systems.
  • Study of the size and shape characteristics of fluoropolymer particles and the effect this has on parameters such as extrusion pressure
  • Global Microscopy Capabilities
 
Expert a dvice is available, so make the call +44 (0) 1642 435788 or email MSGenquiry@intertek.com
 
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TEM Analysis: Nano-silver particles used in the electronics industry.

 

Intertek Analytical Laboratory Resources Ask us a question
email to: MSGenquiry@intertek.com

 

Intertek MSG
Wilton Centre
Wilton
Redcar
TS10 4RF
United Kingdom


Intertek Analytical Laboratory Services Prefer to call?
Tel: +44 (0) 1642 435788
Fax: +44 (0) 1642 435777

 
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