Scanning Electron Microscopy (SEM)

Surface Science Analysis from Intertek MSG

Intertek MSG provides clients with significant expertise and capabilites for the analysis of samples using Scanning Electron Microscopy (SEM). The SEM laboratory produces images with excellent “depth” at low magnifications, at a resolution of 1.5 nanometres at the high end.  A field-emission source renders MSG’s Hitachi S4500 instrument particularly suitable for examining sensitive materials such as polymer latices, biological tissues and pharmaceutical products. Intertek scientists with years of surface science experience can then interpret the data to help clients understand the situations characterised by the SEM images.

SEM Applications:

SEM images present surface morphology in a “viewer-friendly” manner that customers find invaluable for seeing, understanding and illustrating their products. 

Common applications include failure analysis, filler dispersion assessment, particle/feature sizing and contaminant identification.  A picture really does tell a thousand words, and frequently provides some numbers too! 

Associated SEM Techniques:

• Backscattered imaging: a B/S detector generates an image of a flat, polished surface, in which the contrast arises from variations in atomic number within the sample.  This allows us to view multiple phases and locate fillers and contaminants.
• X-ray analysis: see the EDX page to learn how the fluorescence of x-rays allows us to identify and locate elements.
• Cryo-SEM: this page describes how the world of wet systems has been opened up to our high-vacuum instrumentation.

Additional Surface Science Resources:

• Electron Microscopy Intertek MSG
• Global Interek Microscopy Analysis