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Measurement Science Group > Capabilities > Electron Microscopy (SEM)

Electron Microscopy

Scanning Electron Microscopy for Industry and Research

 

A range of imaging and analytical techniques providing morphological, chemical and crystallographic information down to the atomic level.

Methods

  • SEM
  • Secondary electron imaging
  • Backscattered electron imaging
  • Cryo-facility
  • EDX
  • TEM
  • Thin sections
  • Atomic-level resolution
  • Electron diffraction
  • EELS
  • EDX

electron microscopy potato image

Applications of Electron microscopy

  • Electron microscopy allows our customers to see, measure and analyse structures on a range of scales inaccessible by other techniques.
  • Materials investigated include polymers, composites, catalysts, packaging, fabrics, foodstuffs and biological tissues.
  • Identifying unique markers e.g. trace elements within a product to defend against copying and legal claims
  • Identification of unknowns e.g competitive materials or unwanted material from production
  • Safety assessment e.g. occupational hygiene in the workplace
  • Investigation of colour defects in a product e.g. checking for correct polymer additives.
  • Potential for elemental speciation

The MSG advantage

  • SEM
  • Topographic contrast
  • Atomic number contrast
  • Imaging of hydrated materials
  • Elemental composition and element-mapping
  • TEM
  • Crystalline structure
  • Chemical composition
  • Elemental composition and mapping (STEM)
  • Our broad expertise of sample preparation gives us a unique problem-solving capability
 
Advice is available, so make the call +44 (0) 1642 435788 or email MSGenquiry@intertek.com
 
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